Jesson Hu

Jesson Hu currently serves as a Technical Manager at United Microelectronics Corporation (UMC), where he leverages over six years of specialized experience in semiconductor manufacturing and process optimization. In his role, Jesson is primarily dedicated to advancing FAB equipment particle abnormality detection and baseline enhancement, ensuring that manufacturing processes maintain optimal cleanliness and defect control. His expertise in defect sampling and automation system build-up plays a critical role in streamlining operations, reducing yield loss, and enhancing overall process stability.

Jesson’s extensive background in project management of automation system setup and big data analysis enables him to lead cross-functional teams effectively, integrating complex automation solutions with existing fab processes. His profound knowledge of Statistical Process Control (SPC) and Failure Mode and Effects Analysis (FMEA) management allows him to proactively identify potential process deviations and implement robust corrective actions. This expertise is instrumental in defect reduction initiatives, where he applies advanced data analytics and process integration techniques to improve yield and product quality.

Throughout his career, Jesson has demonstrated a strong command of semiconductor manufacturing principles, including metrology, process control, and requirements analysis. His proficiency with Linux and SQL supports his data-driven approach to process monitoring and automation system development. By combining his technical skills with strategic project management, Jesson continuously drives innovation in fab equipment performance, contributing significantly to UMC’s commitment to manufacturing excellence and technological leadership in the semiconductor industry.