Mu-TEST
Mu-TEST is a game changer in the Automated Test Equipment (ATE) industry. Thanks to its revolutionary, FPGA-based hardware, Mu-TEST dramatically reduces the Cost of Test (CoT) for all the IC Semiconductor Companies.
Our Mission :
To develop , market and support unprecedented solutions to help IC SOC suppliers to reduce their COST by 30 to 50%.
Highlight:
Direct Access to our ATE R&D engineering expert to support your project, providing turn key solution
Why Mu-TEST ?
Scalability, Fully evolutionary, Performances, no compromise, Time-to-Market, Easy to use and ... at lowest COO!
Test under radiation:
Test under radiation (ei: Spatial MIL-STD-883E/Method 1020.1) up to 6 meters distance between test equipment and Device under test!
