IONTOF GmbH

Innovative Ion Beam Technology for Surface Analysis ION-TOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometers (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). The company is the leading European manufacturer of Time-of-Flight Secondary Ion Mass Spectrometers (TOF-SIMS) for surface analysis. The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the original conception, the contribution of Muenster by its academics and entrepreneurs to the development and spread of the TOF-SIMS technique has been significant and unceasing. Muenster is certainly the place to visit if you want to know the latest about TOF-SIMS.