Rigaku (Toyko)

About Rigaku (Toyko)

Since its inception in Japan in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. In fact, Rigaku means physical science in Japanese, the core of instrumentation. With hundreds of major innovations to its credit, Rigaku and its subsidiary companies are world leaders in the fields of protein and small molecule X-ray crystallography, general X-ray diffraction, X-ray spectrometry, semiconductor metrology, automation, cryogenics and X-ray optics.

Rigaku employs over 1,000 people worldwide in the manufacture and support of its analytical equipment. Whether supplying the tools to create better semiconductor chips, enabling drug discovery, improving production line quality, or exploring the new frontier of nanotechnology, Rigaku products and services lead with innovation.

Rigaku was chartered to be the world's leading X-ray analytical instrumentation company in quality, cost, and customer enthusiasm through the integration of exceptional people, unparalleled technology, and robust business management. Continuous improvement in all activities, combined with a commitment to total quality, cemented by partnership with our customers, furthers the goal of enabling our clients'​ successes.

By promoting partnerships, dialog, and innovation within the global scientific and industrial community, Rigaku Americas Corporation provides our client markets with fully integrated solutions.

The company and its employees are dedicated to developing and supplying universities, industry, and government labs with the ultimate in customer-focused integrated solutions across a wide variety of disciplines, including structural proteomics, nanoengineering research, general purpose X-ray diffraction and spectroscopy, materials analysis and quality assurance.

Website	http://www.rigaku.com
Employees	1-10 employees View all Rigaku (Toyko) employees
Industry	Appliances, Electrical, and Electronics Manufacturing
Headquarter	4-14-4, Sendagaya, Shibuya-Ku,,Tokyo,JP
Founded	1951
Keywords	X-Ray Diffraction, X-Ray Crystallography, Computed Tomography, Semiconductor Metrology, X-Ray Optics, X-Ray Spectrometry